Wanted: JEOL JSM-6460
Wanted: JEOL JSM-6460
- Brand: Jeol
- Product Code: Wanted: JEOL JSM-6460
- Availability: In Stock
WANTED: JEOL JSM 6460 Scanning Electron Microscope (SEM) with Oxford INCA Energy EDS system and MICS Microscope Image Capture System is a high-performance versatile SEM. The high-precision electron optical system incorporated in this SEM is effectively used with the large flexible specimen chamber that accommodates a 200mm diameter specimen. The easy-to-understand, easy-to-use operation GUI is developed for multi-user environment.
- Magnification (X): 5 to 300000
- Resolution (nm): 3.00
- Accelerating Voltage (kilovolts): 0 to 30
- Digital Display
- Computer Interface
- Optimized for fitting and integrating X-ray spectrometers